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Quantitative Ultrasonic Characterization of c-axis oriented polycrystalline AlN thin film for smart device application

Habib, A, A Shelke, M Vogel, S Brand, Xin Jiang, U Pietsch, S Banerjee, and Tribikram Kundu. 2015. “Quantitative Ultrasonic Characterization of C-Axis Oriented Polycrystalline AlN Thin Film for Smart Device Application”. Acta Acustica United With Acustica 101: 675-83.
Last updated on 02/08/2023